Novel Process and Temperature-Stable, IDD Sensor for the BIST Design of Embedded Digital, Analog, and Mixed-Signal Circuits

This paper proposes a new IDD sensor for built-in self-test (BIST) applications for digital, analog, and mixed-signal circuits. This novel, wide-band, nonintrusive, process and temperature-stable IDD sensor operates up to 230 MHz, which is 2.3X faster than previously proposed designs, and occupies 78.3% less area than another competing design. A BIST utilizing this novel IDD sensor is created and tested on numerous digital circuits, as well as on an op-amp and a mixer, achieving up to 90% fault coverage, while maintaining the performance of the circuit-under-test. The experiments were implemented in 0.18-m TSMC CMOS mixed-signal technology.

[1]  Kaushik Roy,et al.  Frequency Specification Testing of Analog Filters Using Wavelet Transform of Dynamic Supply Current , 2005, J. Electron. Test..

[2]  Salvador Bracho,et al.  Built-in dynamic current sensor for hard-to-detect faults in mixed-signal ICs , 2002, Proceedings 2002 Design, Automation and Test in Europe Conference and Exhibition.

[3]  David A. Johns,et al.  Analog Integrated Circuit Design , 1996 .

[4]  J. Ramirez-Angulo,et al.  A high-speed dynamic current sensor for iDD test based on the flipped voltage follower , 2003, Southwest Symposium on Mixed-Signal Design, 2003..

[5]  Ashok K. Srivastava,et al.  A simple built-in current sensor for IDDQ testing of CMOS data converters , 2005, Integr..

[6]  Kaushik Roy,et al.  A process variation compensating technique with an on-die leakage current sensor for nanometer scale dynamic circuits , 2006, IEEE Transactions on Very Large Scale Integration (VLSI) Systems.

[7]  Bin Xue,et al.  Built-in current sensor for IDDQ test , 2004, Proceedings. 2004 IEEE International Workshop on Current and Defect Based Testing (IEEE Cat. No.04EX1004).

[8]  Alkis A. Hatzopoulos,et al.  A simple built-in current sensor for current monitoring in mixed-signal circuits , 1997 .

[9]  J.R. Vazquez,et al.  Built-in current sensor for /spl Delta/I/sub DDQ/ testing , 2004, IEEE Journal of Solid-State Circuits.

[10]  Jose Pineda de Gyvez,et al.  Built-In Current Sensor for Testing , 2004 .

[11]  Phillip E. Allen,et al.  A process, voltage, and temperature compensated CMOS constant current reference , 2004, 2004 IEEE International Symposium on Circuits and Systems (IEEE Cat. No.04CH37512).

[12]  J.D. van Wyk,et al.  An overview of integratable current sensor technologies , 2003, 38th IAS Annual Meeting on Conference Record of the Industry Applications Conference, 2003..

[13]  Jerzy Dabrowski.  BiST model for IC RF-transceiver front-end , 2003, Proceedings 18th IEEE Symposium on Defect and Fault Tolerance in VLSI Systems.

[14]  Charles E. Stroud,et al.  Benchmark circuits for analog and mixed-signal testing , 1999, Proceedings IEEE Southeastcon'99. Technology on the Brink of 2000 (Cat. No.99CH36300).

[15]  Martin Margala,et al.  A versatile built-in CMOS sensing device for digital circuit parametric test , 2003, IEEE Trans. Instrum. Meas..