论文信息 - Quantification of Ion-Implanted Single-Atom Dopants in Monolayer MoS2 via HAADF STEM Using the TEMUL Toolkit - 字舞流文

Quantification of Ion-Implanted Single-Atom Dopants in Monolayer MoS2 via HAADF STEM Using the TEMUL Toolkit

M. Auge | H. Hofsäss | U. Bangert | M. Hennessy | Eoin Moynihan | E. O'Connell | E. O’Connell