Combined application of Power Spectrum Centroid and Support Vector Machines for measurement improvement in Optical Scanning Systems

In this paper Support Vector Machine (SVM) Regression was applied to predict measurements errors for Accuracy Enhancement in Optical Scanning Systems, for position detection in real life application for Structural Health Monitoring (SHM) by a novel method, based on the Power Spectrum Centroid Calculation in determining the energy center of an optoelectronic signal in order to obtain accuracy enhancement in optical scanning system measurements. In the development of an Optical Scanning System based on a 45^o - sloping surface cylindrical mirror and an incoherent light emitting source, surged a novel method in optoelectronic scanning, it has been found that in order to find the position of a light source and to reduce errors in position measurements, the best solution is taking the measurement in the energy centre of the signal generated by the Optical Scanning System. The Energy Signal Centre is found in the Power Spectrum Centroid and the SVM Regression Method is used as a digital rectified to increase measurement accuracy for Optical Scanning System.

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