First Demonstration of Ruthenium and Molybdenum Word lines Integrated into 40nm Pitch 3D-NAND Memory Devices
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M. Rosmeulen | S. Ramesh | F. Sebaai | L. Nyns | A. Arreghini | Y. Oniki | L. Breuil | J. Stiers | F. Schleicher | K. Katcko | A. Ajaykumar | J. Soulie | G. V. den bosch