An Effective Technique for System-Level Prediction of the Radiated Emissions of Unknown Sources Inside Low-${Q}$ Cavities Using Unit-Level Measurements

A method for predicting electromagnetic emissions from unknown electronic devices and cables inside low-Q cavities is presented. This method is based on measurements at the unit level, equivalent source decomposition, and numerical electromagnetic simulation of the integrated system. The approach is also valid for the analysis of cables and conductors carrying electrical currents from the interior to the exterior of the measurement surface (Huygen's surface) and is useful for the prediction of the electromagnetic compatibility characteristics of electronic devices located inside satellites.

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