Generalized Majority Voter Design Method for N-Modular Redundant Systems Used in Mission- and Safety-Critical Applications

Mission- and safety-critical circuits and systems employ redundancy in their designs to overcome any faults or failures of constituent circuits and systems during the normal operation. In this aspect, the N-modular redundancy (NMR) is widely used. An NMR system is comprised of N identical systems, the corresponding outputs of which are majority voted to generate the system outputs. To perform majority voting, a majority voter is required, and the sizes of majority voters tend to vary depending on an NMR system. Majority voters corresponding to NMR systems are physically realized by enumerating the majority input clauses corresponding to an NMR system and then synthesizing the majority logic equation. The issue is that the number of majority input clauses corresponding to an NMR system is governed by a mathematical combination, the complexity of which increases substantially with increases in the level of redundancy. In this context, the design of a majority voter of any size corresponding to an NMR specification based on a new, generalized design approach is described. The proposed approach is inherently hierarchical and progressive since any NMR majority voter can be constructed from an (N − 2)MR majority voter along with additional logic corresponding to the two extra inputs. Further, the proposed approach paves the way for simultaneous production of the NMR system outputs corresponding to different degrees of redundancy, which is not intrinsic to the existing methods. This feature is additionally useful for any sharing of common logic with diverse degrees of redundancy in appropriate portions of an NMR implementation.

[1]  Elena Dubrova,et al.  Fault-Tolerant Design , 2013 .

[2]  M. Wirthlin,et al.  Fine-Grain SEU Mitigation for FPGAs Using Partial TMR , 2008, IEEE Transactions on Nuclear Science.

[3]  Shambhu Upadhyaya,et al.  Secure and fault-tolerant voting in distributed systems , 2001, 2001 IEEE Aerospace Conference Proceedings (Cat. No.01TH8542).

[4]  J. A. Maestro,et al.  A Methodology for Automatic Insertion of Selective TMR in Digital Circuits Affected by SEUs , 2009, IEEE Transactions on Nuclear Science.

[5]  P. Balasubramanian,et al.  A distributed minority and majority voting based redundancy scheme , 2015, Microelectron. Reliab..

[6]  Lirida A. B. Naviner,et al.  Progressive module redundancy for fault-tolerant designs in nanoelectronics , 2011, Microelectron. Reliab..

[7]  P. Balasubramanian,et al.  Power, Delay and Area Comparisons of Majority Voters relevant to TMR Architectures , 2016, DESIGN, CONSTRUCTION, MAINTENANCE.

[8]  Arnaud Virazel,et al.  Is triple modular redundancy suitable for yield improvement? , 2009, IET Comput. Digit. Tech..

[9]  K.S. Morgan,et al.  SRAM FPGA Reliability Analysis for Harsh Radiation Environments , 2009, IEEE Transactions on Nuclear Science.

[10]  Diana Marculescu,et al.  Multiple Transient Faults in Combinational and Sequential Circuits: A Systematic Approach , 2010, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.

[11]  Xiaoxuan She,et al.  Reducing Critical Configuration Bits via Partial TMR for SEU Mitigation in FPGAs , 2017, IEEE Transactions on Nuclear Science.

[12]  B. Parhami Voting networks , 1991 .

[13]  P. Graham,et al.  Radiation-induced multi-bit upsets in SRAM-based FPGAs , 2005, IEEE Transactions on Nuclear Science.

[14]  Tim Haifley,et al.  Fault-Tolerant ICs: The Reliability of TMR Yield-Enhanced ICs , 1987, IEEE Transactions on Reliability.

[15]  Tian Ban,et al.  A simple fault-tolerant digital voter circuit in TMR nanoarchitectures , 2010, Proceedings of the 8th IEEE International NEWCAS Conference 2010.

[16]  Lawrence T. Clark,et al.  An Embedded Microprocessor Radiation Hardened by Microarchitecture and Circuits , 2016, IEEE Transactions on Computers.

[17]  Israel Koren,et al.  Fault-Tolerant Systems , 2007 .

[18]  Denis Teixeira Franco,et al.  Yield and reliability issues in nanoelectronic technologies , 2006, Ann. des Télécommunications.