A design and implementation methodology for micromachining

The use of standard CMOS processes for micromachining has certain limitations, such as the incompatibility of aluminum bonding pads with the most popular silicon etchants, and the difficulty of obtaining backside patterns on individual die. To overcome these limitations, the Canadian Microelectronics Corporation is developing the Can-MEMS post-processing service, leveraging equipment and expertise at various institutions in Canada. Using a distributed lab to post-process wafers from a CMOS foundry, several features are being offered: (i) a third metal layer (platinum); (ii) a silicon nitride passivation layer; (iii) backside patterning; (iv) anisotropic wet etching of silicon. Design rules for use with these new features have been developed.

[1]  Henry Baltes,et al.  CMOS as sensor technology , 1993 .

[2]  Osamu Tabata pH-controlled TMAH Etchants For Silicon Micromachining , 1995, Proceedings of the International Solid-State Sensors and Actuators Conference - TRANSDUCERS '95.

[3]  Christofer Hierold,et al.  A pure CMOS surface-micromachined integrated accelerometer , 1996 .

[4]  R. Wieler,et al.  Microelectronics design-the CMC environment for research and training in embedded systems , 1996, Proceedings of 1996 Canadian Conference on Electrical and Computer Engineering.

[5]  G. Fedder,et al.  Laminated high-aspect-ratio microstructures in a conventional CMOS process , 1996, Proceedings of Ninth International Workshop on Micro Electromechanical Systems.

[6]  L. Ristić CMOS technology: a base for micromachining , 1989 .