论文信息 - Analysis of off-state leakage mechanisms in GaN-based MIS-HEMTs: Experimental data and numerical simulation - 字舞流文

Analysis of off-state leakage mechanisms in GaN-based MIS-HEMTs: Experimental data and numerical simulation

S. Decoutere | M. V. Hove | G. Verzellesi | M. Meneghini | G. Meneghesso | E. Zanoni | D. Bisi | F. A. Marino | N. Ronchi | S. Stoffels | D. Marcon | S. You