Combinatorial approaches for high-throughput characterization of mechanical properties
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[1] William D. Nix,et al. Mechanical properties of thin films , 1989 .
[2] Xiaokun Zhang,et al. Individualized Pixel Synthesis and Characterization of Combinatorial Materials Chips , 2015 .
[3] C. Schuh,et al. Superelasticity and Shape Memory in Micro‐ and Nanometer‐scale Pillars , 2008 .
[4] Julia R. Greer,et al. Deformation at the nanometer and micrometer length scales: Effects of strain gradients and dislocation starvation , 2007 .
[5] X. Xiang,et al. Solution‐phase synthesis of luminescent materials libraries , 1997 .
[6] I. Takeuchi,et al. High-throughput screening of shape memory alloy thin-film spreads using nanoindentation , 2008 .
[7] Xiangshan Chen,et al. Plane-strain Bulge Test for Thin Films , 2005 .
[8] Norman A. Fleck,et al. A phenomenological theory for strain gradient effects in plasticity , 1993 .
[9] J. Vlassak,et al. Precipitation and thermal fatigue in Ni–Ti–Zr shape memory alloy thin films by combinatorial nanocalorimetry , 2011 .
[10] Huajian Gao,et al. Indentation size effects in crystalline materials: A law for strain gradient plasticity , 1998 .
[11] Julia R. Greer,et al. Size dependence of mechanical properties of gold at the micron scale in the absence of strain gradients , 2005 .
[12] S. Bending,et al. A scanning Hall probe microscope for large area magnetic imaging down to cryogenic temperatures , 2002 .
[13] J. Hutchinson. Plasticity at the micron scale , 2000 .
[14] Alexei Bolshakov,et al. A critical examination of the fundamental relations used in the analysis of nanoindentation data , 1999 .
[15] William D. Nix,et al. Effects of the substrate on the determination of thin film mechanical properties by nanoindentation , 2002 .
[16] G. Pharr,et al. An improved technique for determining hardness and elastic modulus using load and displacement sensing indentation experiments , 1992 .
[17] Closed-cycle refrigerator-cooled scanning SQUID microscope for room-temperature samples , 2001 .
[18] D. Clarke,et al. Size dependent hardness of silver single crystals , 1995 .
[19] Tengfei Jiang,et al. Measurement and analysis of thermal stresses in 3D integrated structures containing through-silicon-vias , 2013, Microelectron. Reliab..
[20] Chang-Ming Chen,et al. Combinatorial Ion Synthesis and Ion Beam Analysis of Materials Libraries , 2004 .
[21] D. Dimiduk,et al. Numerical study on microcompression tests of anisotropic single crystals , 2007 .
[22] L. Brewer,et al. A diffusion-multiple approach for mapping phase diagrams, hardness, and elastic modulus , 2002 .
[23] J. Vlassak,et al. High-throughput analysis of thin-film stresses using arrays of micromachined cantilever beams. , 2008, The Review of scientific instruments.
[24] Keh Chih Hwang,et al. A model of size effects in nano-indentation , 2006 .
[25] Bruce M. Clemens,et al. Combinatorial studies of mechanical properties of Ti–Al thin films using nanoindentation , 2005 .
[26] Samuel D. Bader,et al. Surface magneto-optic Kerr effect , 2000 .
[27] D. E. Kramer,et al. Plastic strain and strain gradients at very small indentation depths , 2001 .
[28] J. Vlassak,et al. Measuring elastoplastic properties of thin films on an elastic substrate using sharp indentation , 2007 .
[29] P. Wright,et al. Evolution of a diffusion aluminide bond coat for thermal barrier coatings during thermal cycling , 2003 .
[30] Yi Cui,et al. Reviving the lithium metal anode for high-energy batteries. , 2017, Nature nanotechnology.
[31] X. Xiang,et al. High throughput synthesis and screening for functional materials , 2004 .
[32] P. Flinn. Principles and Applications of Wafer Curvature Techniques for Stress Measurements in Thin Films , 1988 .
[33] O. Kraft,et al. Mechanical characterisation of hydrogen-induced quasi-cleavage in a metastable austenitic steel using micro-tensile testing , 2016 .
[34] Shaofei Wang,et al. Plating a Dendrite-Free Lithium Anode with a Polymer/Ceramic/Polymer Sandwich Electrolyte. , 2016, Journal of the American Chemical Society.
[35] Michael D. Uchic,et al. A methodology to investigate size scale effects in crystalline plasticity using uniaxial compression testing , 2005 .
[36] C. Motz,et al. Micro-compression testing: A critical discussion of experimental constraints , 2009 .
[37] M. A. Haque,et al. Microscale materials testing using MEMS actuators , 2001 .
[38] H. Koinuma,et al. Combinatorial laser MBE synthesis of 3d ion doped epitaxial ZnO thin films , 2000 .
[39] Michael D. Uchic,et al. Contribution to size effect of yield strength from the stochastics of dislocation source lengths in finite samples , 2007 .
[40] S. Mao. High throughput combinatorial screening of semiconductor materials , 2011 .
[41] Peter G. Schultz,et al. A Combinatorial Approach to Materials Discovery , 1995, Science.
[42] Denis Flandre,et al. Thin films stress extraction using micromachined structures and wafer curvature measurements , 2004 .
[43] M. A. Haque,et al. A review of MEMS-based microscale and nanoscale tensile and bending testing , 2003 .
[44] Ichiro Takeuchi,et al. Monolithic multichannel ultraviolet detector arrays and continuous phase evolution in MgxZn1−xO composition spreads , 2003 .
[45] U. Hartmann. Magnetic force microscopy , 1990 .
[46] N. Chiba,et al. Determining mechanical properties of thin films from the loading curve of nanoindentation testing , 2008 .
[47] Gao,et al. Identification of a blue photoluminescent composite material from a combinatorial library , 1998, Science.
[48] Ken Gall,et al. Stress-induced martensitic transformations and shape memory at nanometer scales , 2006 .
[49] A. Dadgar,et al. Wafer curvature in the nonlinear deformation range , 2004 .
[50] G. Stoney. The Tension of Metallic Films Deposited by Electrolysis , 1909 .
[51] Ji-Cheng Zhao,et al. A combinatorial approach for structural materials , 2001 .
[52] Joost J. Vlassak,et al. Plastic deformation of freestanding thin films: Experiments and modeling , 2006 .
[53] Mohamed Henini,et al. Real‐time scanning Hall probe microscopy , 1996 .
[54] X. Sun,et al. New phosphor (Gd2−xZnx)O3−δ:Eu3+ with high luminescent efficiency and superior chromaticity , 1998 .
[55] X. Xiang,et al. Combinatorial material preparation , 2002 .
[56] H. Fraser,et al. Application of micro-sample testing to study fundamental aspects of plastic flow , 2006 .
[57] Chen Gao,et al. Electro-optic measurements of the ferroelectric-paraelectric boundary in Ba1−xSrxTiO3 materials chips , 2000 .
[58] Alfred Ludwig,et al. MEMS tools for combinatorial materials processing and high-throughput characterization , 2004 .
[59] Mostafa M. Abdalla,et al. Celebrating the 100th anniversary of the Stoney equation for film stress: Developments from polycrystalline steel strips to single crystal silicon wafers , 2009 .
[60] William N. Sharpe,et al. Microscale Characterization of Mechanical Properties , 2007 .
[61] M. A. Haque,et al. In-situ tensile testing of nano-scale specimens in SEM and TEM , 2002 .
[62] H. Koinuma,et al. Strong correlation between high-temperature electronic and low-temperature magnetic ordering in La 1 − x Ca x MnO 3 continuous phase diagram , 2001 .
[63] Joost J. Vlassak,et al. Bauschinger effect in thin metal films , 2005 .
[64] L. B. Freund,et al. Extensions of the Stoney formula for substrate curvature to configurations with thin substrates or large deformations , 1999 .
[65] William Chang. X-Ray Techniques for Characterization of Combinatorial Materials Libraries , 2004 .
[66] Mark R. Freeman,et al. Advances in Magnetic Microscopy , 2001, Science.
[67] X. Xiang,et al. Identification and optimization of advanced phosphors using combinatorial libraries , 1997 .
[68] L. Brewer,et al. A Diffusion Multiple Approach for the Accelerated Design of Structural Materials , 2002 .
[69] D. Dimiduk,et al. Sample Dimensions Influence Strength and Crystal Plasticity , 2004, Science.
[70] William C. Tang,et al. Laterally Driven Polysilicon Resonant Microstructures , 1989 .
[71] I. Takeuchi,et al. Room temperature ferromagnetic n-type semiconductor in (In1−xFex)2O3−σ , 2005 .
[72] Mitsuhiro Shikida,et al. Tensile-mode fatigue testing of silicon films as structural materials for MEMS , 2001 .
[73] Ichiro Takeuchi,et al. Quantitative scanning evanescent microwave microscopy and its applications in characterization of functional materials libraries , 2005 .
[74] Joost J. Vlassak,et al. A new bulge test technique for the determination of Young’s modulus and Poisson’s ratio of thin films , 1992 .
[75] David C. Joy,et al. Scanning Electron Microscopy and X-Ray Microanalysis , 2017 .
[76] E. Arzt. Size effects in materials due to microstructural and dimensional constraints: a comparative review , 1998 .
[77] X. Xiang,et al. High-Throughput Screening of Electrical Impedance of Functional Materials by Evanescent Microwave Probe , 2003 .
[78] Kuang-Shun Ou,et al. Modification of curvature-based thin-film residual stress measurement for MEMS applications , 2002 .
[79] Y. Chu,et al. Continuous mapping of structure–property relations in Fe1−xNix metallic alloys fabricated by combinatorial synthesis , 2001 .
[80] P. Schultz,et al. A Class of Cobalt Oxide Magnetoresistance Materials Discovered with Combinatorial Synthesis , 1995, Science.