Exploring topological defects in epitaxial BiFeO3 thin films.
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Sergei V. Kalinin | R. Vasudevan | I. Lin | V. Nagarajan | Y. Chu | N. Balke | L. Chen | Pingping Wu | Yi-Chun Chen | S. Bhattacharya | H. Tai | S. Bhattacharya
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Sergei V. Kalinin | R. Vasudevan | I. Lin | V. Nagarajan | Y. Chu | N. Balke | L. Chen | Pingping Wu | Yi-Chun Chen | S. Bhattacharya | H. Tai | S. Bhattacharya