High-Frequency Low-Distortion One-Tone and Two-Tone Signal Generation Using Arbitrary Waveform Generator

This paper describes analysis, simulation and experiment verification of high-frequency one-tone and two-tone low-distortion signal generation methods with an arbitrary waveform generator (AWG) for analog/mixed-signal IC testing. Our previously proposed phase switching method was limited to low-frequency signal generation, and it cannot be used directly for high-frequency signal generation. We propose here a method for generating a low-distortion high-frequency signal (i.e., the frequency close to the Nyquist frequency of the AWG) with an AWG, and show its theoretical analysis and simulation results. With this proposed method, 3rd order harmonics of the generated signal are suppressed simply by changing the AWG program (or waveform memory contents)—AWG nonlinearity identification is not required—and spurious components, generated far from the signal band, are relatively easy to remove using an analog filter.

[1]  Kwang-Ting Cheng,et al.  Recent Advances in Analog, Mixed-Signal, and RF Testing , 2010, IPSJ Trans. Syst. LSI Des. Methodol..

[2]  Kiichi Niitsu,et al.  Low-Distortion Sinewave Generation Method Using Arbitrary Waveform Generator , 2012, J. Electron. Test..

[3]  Shohei Shibuya,et al.  High-frequency low-distortion signal generation algorithm with arbitrary waveform generator , 2015, 2015 IEEE 11th International Conference on ASIC (ASICON).

[4]  Haruo Kobayashi,et al.  A technique for dynamic range improvement of intermodulation distortion products for an Interpolating DAC-based Arbitrary Waveform Generator using a phase switching algorithm , 2017, 2017 IEEE 35th VLSI Test Symposium (VTS).

[5]  Kenji Sawada,et al.  Low-distortion signal generation for ADC testing , 2014, 2014 International Test Conference.

[6]  Tomonori Yanagida,et al.  High-frequency low-distortion one-tone and two-tone signal generation using arbitrary waveform generator , 2016, 2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT).

[7]  Akinori Maeda A Method to Generate a Very Low Distortion, High Frequency Sine Waveform Using an AWG , 2008, 2008 IEEE International Test Conference.

[8]  Peter Sarson,et al.  Using Distortion Shaping Technique to Equalize ADC THD Performance Between ATEs , 2016, 2016 IEEE 21st International Mixed-Signal Testing Workshop (IMSTW).

[9]  Kiichi Niitsu,et al.  Two-Tone Signal Generation for ADC Testing , 2013, IEICE Trans. Electron..