Reliability evaluation for single event crosstalk via probabilistic transfer matrix
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Peng Bai | Li Cai | Weidong Peng | Baojun Liu
[1] Altaf Mukati,et al. A survey of memory error correcting techniques for improved reliability , 2011, J. Netw. Comput. Appl..
[2] Zhi Yang,et al. Interconnect crosstalk noise evaluation in deep-submicron technologies , 2009, Microelectron. Reliab..
[3] Selahattin Sayil,et al. Single Event crosstalk shielding for CMOS logic , 2009, Microelectron. J..
[4] R.C. Baumann,et al. Radiation-induced soft errors in advanced semiconductor technologies , 2005, IEEE Transactions on Device and Materials Reliability.
[5] D. Munteanu,et al. Modeling and Simulation of Single-Event Effects in Digital Devices and ICs , 2008, IEEE Transactions on Nuclear Science.
[6] Frédéric Saigné,et al. MC-ORACLE: A tool for predicting Soft Error Rate , 2011, Comput. Phys. Commun..
[7] M. L. Alles,et al. Radiation effects in new materials for nano-devices , 2011 .
[8] Lloyd W. Massengill,et al. Basic mechanisms and modeling of single-event upset in digital microelectronics , 2003 .
[9] John P. Hayes,et al. Probabilistic transfer matrices in symbolic reliability analysis of logic circuits , 2008, TODE.
[10] John P. Hayes,et al. Accurate reliability evaluation and enhancement via probabilistic transfer matrices , 2005, Design, Automation and Test in Europe.