A self-consistent semi-empirical absorption correction technique

Abstract A method of calculating azimuthal scans for subsequent correction of X-ray diffractometer intensity data for absorption is described. The technique is based on the premise that systematic differences observed in the intensities of symmetry equivalent reflections (measured during data collection) are due to the relative transmission factors as a function of the primary and secondary beam path directions. Azimuthal scans are calculated from a least squares fit to these equivalent reflections; these scans may then be applied to the data to correct for absorption according to a simple geometric model.