Effect of annealing on molybdenum doped indium oxide thin films RF sputtered at room temperature

Abstract Thin films of molybdenum doped indium oxide (IMO) were deposited on glass at room temperature using an in-built three-source RF magnetron sputtering. The films were studied as a function of oxygen volume percentage (O 2  vol. %; ranging from 0.0 to 17.5%) in the sputtering chamber. The as-deposited amorphous films were crystallized on post-annealing. The as-deposited films are low conducting and Hall coefficients were undetectable; whereas post-annealed films possess fairly high conductivity. The lowest transmittance (11.96% at 600 nm) observed from the films deposited without oxygen increased to a maximum of 88.01% (3.5 O 2  vol. %); whereas this transmittance was decreased with the increasing O 2  vol. % to as low as 81.04% (15.6 O 2  vol. %); a maximum of 89.80% was obtained from the films annealed at 500 °C in open air (3.5 O 2  vol. %). The optical band gap of 3.80 eV obtained from the films deposited without oxygen increased with increasing O 2  vol. % to as high as 3.91 eV (17.5 O 2  vol. %). A maximum of 3.92 eV was obtained from the films annealed at 300 °C in N 2 :H 2 gas atmosphere (17.5 O 2  vol. %).

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