论文信息 - iRULE: fast hot-carrier reliability diagnosis using macro-models

iRULE: fast hot-carrier reliability diagnosis using macro-models

In this paper, we present a new reliability diagnosis tool (iRULE) for the design of hot-carrier resistant MOS circuits. Unlike conventional reliability CAD tools which are usually simulation-based, iRULE is rule-based in nature. The computational complexity of iRULE is linear with respect to the number of transistors. Compared with the circuit-level reliability simulation tools, iRULE is slightly less accurate, but much faster. It makes the reliability diagnosis for VLSI circuits with several million transistors feasible even on a desktop workstation.<<ETX>>

Sung-Mo Kang | Chin-Chi Teng | Peng Fang | Weishi Sun | J. Yue

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