Process for error correction by de-embedding of scattering parameters, network analyzer and switching module

The invention relates to a method for correcting errors by de-embedding dispersion parameters of a measuring object associated with measuring gates (11), said parameters being measured by a vectorial network analyst comprising n measuring gates. The aim of the invention is to create a universal, precise and fast means of correcting errors of dispersion parameters. To this end, the method comprises the following steps: formula (1) two-port calibrations are carried out on different calibrating standards in any order in the active state between the measuring gates (11), as a basis for a first error correction; the reflection parameters of at least one part of the n measuring gates (11) are determined in the inactive state, by means of the results of two-port measurements carried out on at least one calibrating standard switched in the active and/or inactive state on measuring gates (11), as a basis for a second error correction. The invention also relates to a network analyst and to a switching module for a network analyst, said elements comprising adequate means.