Fourier transform analysis method for modeling the positions and properties of cavity defects in Fabry–Pérot laser diodes

A simple and fast model is presented, which allows the determination of defect positions within a high-power laser emitter cavity and an estimation of their transmission properties. The model is based upon the calculation of the cavity transmission spectrum below threshold and the analysis of its fast Fourier transform. Modeled and experimental results are compared, showing good correlation. The speed and simplicity of the model means that it is applicable as a screening process for the detection and characterization of defects in manufactured lasers.

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