A Single-Chip 60-V Bulk Charger for Series Li-Ion Batteries With Smooth Charge-Mode Transition

In this paper, a single-chip 60-V battery charger prototype is presented. The newly proposed charge mode transition can ensure smooth transitions between incremental current (IC), constant current (CC), and constant voltage (CV) modes. The charger sources a current of 136 mA in CC mode and has an efficiency up to 92% during the charging sequence. Intentional saturation of both the IC and CV regulation loops ensure the stability of the charger throughout the charging sequence. Bonding PAD designed to remove the constraints on the aspect ratio of input transistors as a prevention of antenna effect is also disclosed. The proposed design has been implemented on silicon using the TSMC 0.25 μm 1-poly 3-metal bipolar-CMOS-DMOS (BCD) 60-V process.

[1]  J. Lau,et al.  A LDMOS technology compatible with CMOS and passive components for integrated RF power amplifiers , 2000, IEEE Electron Device Letters.

[2]  J. McVittie,et al.  Thin-oxide damage from gate charging during plasma processing , 1992, IEEE Electron Device Letters.

[3]  Davide Andrea,et al.  Battery Management Systems for Large Lithium Ion Battery Packs , 2010 .

[4]  Zheng Li.  Power Management Integrated Circuits Design, Functionality Analysis And Applications , 2005 .

[5]  C. Gendarme,et al.  CMOS Circuit Design, Layout, and Simulation, 2nd edition [Book Review] , 2006, IEEE Circuits and Devices Magazine.

[6]  C. Hu,et al.  Thin oxide damage by plasma etching and ashing processes , 1992, 30th Annual Proceedings Reliability Physics 1992.

[7]  Kenneth W. Martin,et al.  Digital Integrated Circuit Design , 1999 .

[8]  Jiann-Jong Chen,et al.  A High-Efficiency Multimode Li–Ion Battery Charger With Variable Current Source and Controlling Previous-Stage Supply Voltage , 2009, IEEE Transactions on Industrial Electronics.

[9]  A. Richard Newton,et al.  SPICE3 Version 3f3 User s Manual , 1993 .

[10]  Jiann-Jong Chen,et al.  New Compact CMOS Li-Ion Battery Charger Using Charge-Pump Technique for Portable Applications , 2007, IEEE Transactions on Circuits and Systems I: Regular Papers.

[11]  Calvin T. Gabriel,et al.  How plasma etching damages thin gate oxides , 1992 .

[12]  Israel Koren,et al.  Layer reassignment for antenna effect minimization in 3-layer channel routing , 1996, Proceedings. 1996 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems.

[13]  Willy Sansen,et al.  analog design essentials , 2011 .

[14]  Ming-Dou Ker,et al.  Circuit and Layout Co-Design for ESD Protection in Bipolar-CMOS-DMOS (BCD) High-Voltage Process , 2010, IEEE Transactions on Circuits and Systems I: Regular Papers.

[15]  R. Jacob Baker,et al.  CMOS Circuit Design, Layout, and Simulation , 1997 .

[16]  Gabriel A. Rincón-Mora,et al.  Accurate, Compact, and Power-Efficient Li-Ion Battery Charger Circuit , 2006, IEEE Transactions on Circuits and Systems II: Express Briefs.

[17]  Chua-Chin Wang,et al.  A high voltage battery charger with smooth charge mode transition in BCD process , 2011, 2011 IEEE International Symposium of Circuits and Systems (ISCAS).

[18]  Ke-Horng Chen,et al.  A Li-Ion Battery Charger With Smooth Control Circuit and Built-In Resistance Compensator for Achieving Stable and Fast Charging , 2010, IEEE Transactions on Circuits and Systems I: Regular Papers.

[19]  Chenming Hu,et al.  TOPICAL REVIEW: Thin gate oxide damage due to plasma processing , 1996 .