IEEE 1149 standards - Changing testing, silicon to systems

After an introduction to IEEE standards development, the five active standards projects in the IEEE 1149 family are described briefly. Some just promulgated changes to ANSI/IEEE Std 1149.1 are presented. Among these changes are two new optional instructions intended to aid testing of product which require both in-circuit and boundary-scan testing and subordination of the 1149.1 Test Access Port to higher level test control. Updates on the status of IEEE P1149.2 and IEEE P1149.5 are presented.<<ETX>>

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