New fault models and efficient BIST algorithms for dual-port memories
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Husni Al-Muhtaseb | Radwan E. Abdel-Aal | Mohamed Y. Osman | Alaaeldin A. Amin | R. Abdel-Aal | Alaaeldin A. M. Amin | H. Al-Muhtaseb | Mohamed Y. Osman
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