Ultrafast dark-field interferometric microscopic reflectometry.

A new method of ultrafast dark-field correlation interferometry from reflective microscopic objects is described. A 120-fs single-shot registration is achieved with a dynamic range of >35 dB, a sensitivity of <-50 dB, and a resolution of 15 mm. To demonstrate the potential of the method, we measured the thickness of single-mode fiber cladding to be 19 microm.