Dynamic Range Extension of CMOS Image Sensors using Multi-Integration Technique with Compact readout

A multi-integration technology with compact readout method to extend CMOS image sensor's dynamic range is presented. Compared with the timing of rolling readout, compact readout extends the available pixel readout time by adjusting the time-domain offset between two adjacent rows and each integration time in one frame. Thus the column readout bus is working continuously rather than intermittently, which makes good use of the whole integration time and the available readout time can be extended. This dynamic range extension technology was implemented on a prototype chip with a 128 × 128 pixel array. The pixel readout time with compact readout method is almost as 3 times long as the one with rolling readout method while 39 dB dynamic range extension is achieved at 120 fps.

[1]  Orly Yadid-Pecht,et al.  Wide intrascene dynamic range CMOS APS using dual sampling , 1997 .

[2]  O. Yadid-Pecht,et al.  Wide-Dynamic-Range CMOS Image Sensors—Comparative Performance Analysis , 2009, IEEE Transactions on Electron Devices.

[3]  D. Joseph,et al.  Transient Response and Fixed Pattern Noise in Logarithmic CMOS Image Sensors , 2007, IEEE Sensors Journal.

[4]  Yuanjin Zheng,et al.  High linearity 8-Bit VCO-Based Cascaded σδADC for Digital DC-DC Converters , 2012, J. Circuits Syst. Comput..

[5]  Desire Sidibé,et al.  Ghost detection and removal for high dynamic range images: Recent advances , 2012, Signal Process. Image Commun..

[6]  Joaquim Salvi,et al.  Review of CMOS image sensors , 2006, Microelectron. J..

[7]  Amine Bermak,et al.  Pulse-Modulation Imaging—Review and Performance Analysis , 2011, IEEE Transactions on Biomedical Circuits and Systems.

[8]  A. El Gamal,et al.  CMOS image sensors , 2005, IEEE Circuits and Devices Magazine.

[9]  Andrew Berry,et al.  A CMOS analog integrated circuit for pixel X-Ray detector , 2009, Proceedings of the 2009 12th International Symposium on Integrated Circuits.