Experimental and numerical characterization of microwave structures at cryogenic temperatures

In this paper we present experimental results for some microwave and millimeter-wave planar structures from room temperature to 10°K. The structures are designed and electromagnetically analyzed by means of two of the most popular EM software packages on the market. The structures were fabricated on 25-mil-thick Al2O3 substrates and the electrical characterization was performed in a test bench integrated with a vector network analyzer HP 8110-C and an in-house-developed cryogenic chamber based on the CTI-Cryogenic closed-cycle unit. © 2006 Wiley Periodicals, Inc. Microwave Opt Technol Lett 48: 547–553, 2006; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.21405