Substrate guided-wave holo-interferometry

This paper describes a new tool for experimental mechanics called substrate guided wave (SGW) holo-interferometry. The approach relies on recording and reconstructing time- average, double-exposure, and real-time holograms using light waves guided to the hologram by a dielectric sheet, or substrate waveguide. The study illustrates that SGW holo- interferometry can be used to isolate the reference wavefront from the environment surrounding the hologram, and can be applied to measure the mechanical properties of the substrate itself. These attributes are discussed along with experimental work performed to develop and refine the technique.

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