Test-set preserving logic transformations

Logic transformations that preserve minimal or complete test sets of a combinational circuit are examined. Some basic transformation types are rigorously defined and characterized with respect to test-set preservation. The authors apply the transformations to adder design and show that any complete test set for a two-level adder is preserved on transformation to ripple-carry and carry-lookahead designs, thus verifying some recent simulation results.<<ETX>>

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