论文信息 - Comparison of wear characteristics of etched-silicon and carbon nanotube atomic-force microscopy probes

Comparison of wear characteristics of etched-silicon and carbon nanotube atomic-force microscopy probes

The resolution and wear properties of carbon nanotube and etched-silicon atomic force microscopy probes are compared in intermittent-contact mode. Carbon nanotube probes have at least 20 times the life of etched-silicon probes and provide better resolution at all stages. Sample wear is minimized with carbon nanotube probes.

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