Differential Ideality Factor Technique for Extraction of Subgap Density of States in Amorphous InGaZnO Thin-Film Transistors
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Dong Myong Kim | Jaehyeong Kim | Dae Hwan Kim | Daeyoun Yun | D. M. Kim | D. Kim | D. Yun | Jaehyeong Kim | Inseok Hur | Minkyung Bae | Woojoon Kim | Hyun Kwang Jeong | Dongsik Kong | Yong-Sung Kim | H. Jeong | Woojoon Kim | Inseok Hur | Yongsik Kim | Dongsik Kong | M. Bae
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