论文信息 - Optically Controlled Millimeter-Wave Devices

Optically Controlled Millimeter-Wave Devices

A dynamic bridge method has been developed to measure the time varying phase shift and attenuation of millimeter-waves in semiconductor waveguides when perturbed by optically induced plasmas. The resolution of this technique is 2 ns in real time. Comparison of this method with a theoretical model is also discussed.

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