Design diversity for concurrent error detection in sequential logic circuits

We present a technique using diverse duplication to implement concurrent error detection (CED) in sequential logic circuits. We examine three different approaches for this purpose: (1) identical state encoding of the two sequential logic implementations, duplication of flip-flops, diverse implementation of the combinational logic part (output logic and next-state logic) and comparators on flip-flop outputs and primary outputs; (2) diverse state encoding of the two implementations, duplication of flip-flops, diverse combinational logic implementation and comparators on primary outputs only; and (3) identical state encoding, parity prediction for the flip-flops, diverse combinational logic implementation, comparators on primary outputs and parity checkers on flip-flop outputs. Our results for the simulated sequential benchmark circuits demonstrate that the third approach is most efficient in protecting sequential logic circuits against multiple and common-mode failures. The computational complexity of the data integrity analysis of the third approach is of the same order as that of the first approach and is at least an order of magnitude less than that of the second approach.

[1]  Tiziano Villa,et al.  NOVA: State Assignment of Finite State Machines for Optimal Two-Level Logic Implementations , 1989, 26th ACM/IEEE Design Automation Conference.

[2]  Ronald Riter,et al.  Modeling and testing a critical fault-tolerant multi-process system , 1995, Twenty-Fifth International Symposium on Fault-Tolerant Computing. Digest of Papers.

[3]  Edward J. McCluskey,et al.  Common-mode failures in redundant VLSI systems: a survey , 2000, IEEE Trans. Reliab..

[4]  Edward J. McCluskey,et al.  A design diversity metric and reliability analysis for redundant systems , 1999, International Test Conference 1999. Proceedings (IEEE Cat. No.99CH37034).

[5]  Edward J. McCluskey,et al.  Finite state machine synthesis with concurrent error detection , 1999, International Test Conference 1999. Proceedings (IEEE Cat. No.99CH37034).

[6]  Nur A. Touba,et al.  Logic synthesis of multilevel circuits with concurrent error detection , 1997, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

[7]  Kenneth P. Parker,et al.  The Boundary-Scan Handbook , 1992, Springer US.

[8]  Edward J. McCluskey,et al.  Combinational logic synthesis for diversity in duplex systems , 2000, Proceedings International Test Conference 2000 (IEEE Cat. No.00CH37159).

[9]  P. R. Stephan,et al.  SIS : A System for Sequential Circuit Synthesis , 1992 .

[10]  Edward J. McCluskey,et al.  Dependable Computing and Online Testing in Adaptive and Configurable Systems , 2000, IEEE Des. Test Comput..

[11]  Algirdas Avizienis,et al.  Fault Tolerance by Design Diversity: Concepts and Experiments , 1984, Computer.

[12]  Pascal Traverse,et al.  AIRBUS A320/A330/A340 electrical flight controls - A family of fault-tolerant systems , 1993, FTCS-23 The Twenty-Third International Symposium on Fault-Tolerant Computing.

[13]  J. H. Lala,et al.  Architectural principles for safety-critical real-time applications , 1994, Proc. IEEE.

[14]  Lisa Spainhower,et al.  IBM S/390 Parallel Enterprise Server G5 fault tolerance: A historical perspective , 1999, IBM J. Res. Dev..

[15]  Edward J. McCluskey,et al.  Which concurrent error detection scheme to choose ? , 2000, Proceedings International Test Conference 2000 (IEEE Cat. No.00CH37159).

[16]  Robert S. Swarz,et al.  Reliable Computer Systems: Design and Evaluation , 1992 .

[17]  Santosh K. Shrivastava,et al.  Reliable Computer Systems , 1985, Texts and Monographs in Computer Science.