Lattice Deformation at Submicron Scale: X-Ray Nanobeam Measurements of Elastic Strain in Electron Shuttling Devices
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G. Capellini | M. Virgilio | C. Richter | L. Schreiber | W. Langheinrich | M. Zoellner | E. Zatterin | K. Anand | Y. Yamamoto | I. Zaitsev | A. A. Corley-Wiciak | C. Manganelli | C. Corley-Wiciak | F. Reichmann