Substrate-aware mixed-signal macro-cell placement in WRIGHT

In this paper we describe a set of algorithms for handling substrate-coupled switching noise in an iterative placement framework. Our model for switching noise uses a coarse resistive grid method for analyzing the coupling of digital switching noise into the analog macros on the chip. The noise effects determined through these models are incorporated into a constrained, simulated annealing based macro cell placement flow. Our results indicate that these substrate-aware algorithms support efficient mixed signal placement optimization.<<ETX>>

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