Tolerance limits and methodologies for IMRT measurement‐based verification QA
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Ping Xia | Nikos Papanikolaou | Todd Pawlicki | Daniel A Low | Moyed Miften | Jie Shi | Krishni Wijesooriya | Andrea Molineu | Dimitris Mihailidis | Harold Li | Jean Moran | Arthur Olch | T. Pawlicki | P. Xia | D. Low | K. Wijesooriya | J. Moran | A. Molineu | A. Olch | N. Papanikolaou | D. Mihailidis | Jie Shi | M. Miften | Harold H. Li
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