A new approach for the prediction of the neutron-induced SEU rate
暂无分享,去创建一个
J. Gasiot | J.-M. Palau | M.-C. Calvet | C. Vial | S. Fourtine | M. Calvet | S. Fourtine | J. Palau | J. Gasiot | C. Vial
[1] P. J. Cooper,et al. The role of thermal and fission neutrons in reactor neutron-induced upsets in commercial SRAMs , 1997 .
[2] C. Detcheverry,et al. SEU critical charge and sensitive area in a submicron CMOS technology , 1997 .
[3] A. Taber,et al. Single event upset in avionics , 1993 .
[4] E. Normand,et al. Incorporation of ENDF-V neutron cross section data for calculating neutron-induced single event upsets , 1989 .
[5] J. Ziegler,et al. Effect of Cosmic Rays on Computer Memories , 1979, Science.
[6] Robert Ecoffet,et al. SEU response of an entire SRAM cell simulated as one contiguous three dimensional device domain , 1998 .
[7] E. Normand,et al. Guidelines for predicting single-event upsets in neutron environments (RAM devices) , 1991 .
[8] S. Wender,et al. Single event phenomena in atmospheric neutron environments , 1993 .
[9] J. Olsen,et al. Neutron-induced single event upsets in static RAMS observed a 10 km flight attitude , 1993 .
[10] Richard E. Lingenfelter,et al. Cosmic‐ray neutron demography , 1961 .
[11] E. Normand. Single-event effects in avionics , 1996 .
[12] E. L. Petersen. Nuclear Reactions in Semiconductors , 1980, IEEE Transactions on Nuclear Science.
[13] G. R. Srinivasan,et al. Parameter-free, predictive modeling of single event upsets due to protons, neutrons, and pions in terrestrial cosmic rays , 1994 .
[14] T. Baker,et al. Altitude and latitude variations in avionics SEU and atmospheric neutron flux , 1993 .
[15] J. Farren,et al. The single event upset environment for avionics at high latitude , 1994 .
[16] P. S. Winokur,et al. Three-dimensional simulation of charge collection and multiple-bit upset in Si devices , 1994 .