A new approach for the prediction of the neutron-induced SEU rate

A new approach for SEU rate prediction in components submitted to neutron environment is presented. The method aims to take into account the characteristics of the secondary particles in terms of electrical effect. So, in addition to the critical energy/charge criterion generally used until now, two criteria are tentatively proposed : a critical LET and a limited distance in which energy must be deposited. The starting point of each computation is a common neutron-silicon interaction database.

[1]  P. J. Cooper,et al.  The role of thermal and fission neutrons in reactor neutron-induced upsets in commercial SRAMs , 1997 .

[2]  C. Detcheverry,et al.  SEU critical charge and sensitive area in a submicron CMOS technology , 1997 .

[3]  A. Taber,et al.  Single event upset in avionics , 1993 .

[4]  E. Normand,et al.  Incorporation of ENDF-V neutron cross section data for calculating neutron-induced single event upsets , 1989 .

[5]  J. Ziegler,et al.  Effect of Cosmic Rays on Computer Memories , 1979, Science.

[6]  Robert Ecoffet,et al.  SEU response of an entire SRAM cell simulated as one contiguous three dimensional device domain , 1998 .

[7]  E. Normand,et al.  Guidelines for predicting single-event upsets in neutron environments (RAM devices) , 1991 .

[8]  S. Wender,et al.  Single event phenomena in atmospheric neutron environments , 1993 .

[9]  J. Olsen,et al.  Neutron-induced single event upsets in static RAMS observed a 10 km flight attitude , 1993 .

[10]  Richard E. Lingenfelter,et al.  Cosmic‐ray neutron demography , 1961 .

[11]  E. Normand Single-event effects in avionics , 1996 .

[12]  E. L. Petersen Nuclear Reactions in Semiconductors , 1980, IEEE Transactions on Nuclear Science.

[13]  G. R. Srinivasan,et al.  Parameter-free, predictive modeling of single event upsets due to protons, neutrons, and pions in terrestrial cosmic rays , 1994 .

[14]  T. Baker,et al.  Altitude and latitude variations in avionics SEU and atmospheric neutron flux , 1993 .

[15]  J. Farren,et al.  The single event upset environment for avionics at high latitude , 1994 .

[16]  P. S. Winokur,et al.  Three-dimensional simulation of charge collection and multiple-bit upset in Si devices , 1994 .