Development and analysis of a software tool for stitching three dimensional surface topography data sets

This paper presents development and application of a new software solution for stitching surface three-dimensional topography data where best matching positions are detected through maximization of a cross-correlation function. Differently from other stitching software tools developed in the past, the one here presented is based not on colour gradients but on matching of physical coordinates. The developed routine fully compensates positioning errors occurring when the measuring instrument is displaced relative to the surface. Qualitative as well as quantitative analyses were carried out in order to verify the applicability of the stitching process. Both synthetic and real scanned surfaces were used for testing. It was demonstrated that misalignments after software compensation are negligible: sub-pixel level inaccuracies, with absolute deviations <0.2%, were in fact verified when stitching two images. The method was developed specifically for atomic force microscopy, but can be effectively applied to any 3D topography measuring instrument.