A model for conductor failure considering diffusion concurrently with electromigration resulting in a current exponent of 2

A model was constructed for electromigration failure where both Fickian diffusion and mass transport due to the electromigration driving force are considered concurrently. The solution to the resulting diffusion equation yields a current exponent of 2 and an activation energy consistent with grain‐boundary self‐diffusion. A modification of the standard median time to failure equation first proposed by Black is suggested.

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