Electron ptychography of 2D materials to deep sub-ångström resolution
暂无分享,去创建一个
Veit Elser | David A. Muller | Mark W. Tate | Prafull Purohit | Sol M. Gruner | Zhen Chen | Saien Xie | Yimo Han | D. Muller | V. Elser | Jiwoong Park | M. Tate | S. Gruner | Yimo Han | Hui Gao | Saien Xie | P. Purohit | Yi Jiang | Hui Gao | Jiwoong Park | P. Deb | Yi Jiang | Zhen Chen | Pratiti Deb
[1] P. Nellist,et al. Electron ptychographic phase imaging of light elements in crystalline materials using Wigner distribution deconvolution. , 2017, Ultramicroscopy.
[2] Peng Wang,et al. Electron ptychographic microscopy for three-dimensional imaging , 2017, Nature Communications.
[3] A. Kirkland,et al. Electron Ptychographic Diffractive Imaging of Boron Atoms in LaB6 Crystals , 2017, Scientific Reports.
[4] R. Bücker,et al. Low-dose cryo electron ptychography via non-convex Bayesian optimization , 2017, Scientific Reports.
[5] Qian Chen,et al. Adaptive step-size strategy for noise-robust Fourier ptychographic microscopy. , 2016, Optics express.
[6] George Barbastathis,et al. Denoised Wigner distribution deconvolution via low-rank matrix completion. , 2016, Optics express.
[7] Malcolm L. H. Green,et al. Simultaneous atomic-resolution electron ptychography and Z-contrast imaging of light and heavy elements in complex nanostructures , 2016, Nature Communications.
[8] J. Biskupek,et al. Chromatic Aberration Correction for Atomic Resolution TEM Imaging from 20 to 80 kV. , 2016, Physical review letters.
[9] D. Muller,et al. High Dynamic Range Pixel Array Detector for Scanning Transmission Electron Microscopy , 2015, Microscopy and Microanalysis.
[10] Ivan Lazić,et al. Phase contrast STEM for thin samples: Integrated differential phase contrast. , 2016, Ultramicroscopy.
[11] S D Findlay,et al. Towards quantitative, atomic-resolution reconstruction of the electrostatic potential via differential phase contrast using electrons. , 2015, Ultramicroscopy.
[12] H. Sawada,et al. Atomic-Resolution STEM Imaging of Graphene at Low Voltage of 30 kV with Resolution Enhancement by Using Large Convergence Angle. , 2015, Physical review letters.
[13] S D Findlay,et al. Modelling the inelastic scattering of fast electrons. , 2015, Ultramicroscopy.
[14] Lewys Jones,et al. Efficient phase contrast imaging in STEM using a pixelated detector. Part 1: experimental demonstration at atomic resolution. , 2015, Ultramicroscopy.
[15] L. Kourkoutis,et al. Periodic Artifact Reduction in Fourier Transforms of Full Field Atomic Resolution Images , 2015, Microscopy and Microanalysis.
[16] Peng Li,et al. Ptychographic inversion via Wigner distribution deconvolution: noise suppression and probe design. , 2014, Ultramicroscopy.
[17] Timothy C. Berkelbach,et al. Tailoring the electronic structure in bilayer molybdenum disulfide via interlayer twist. , 2014, Nano letters.
[18] M. Campbell,et al. Count rate linearity and spectral response of the Medipix3RX chip coupled to a 300μm silicon sensor under high flux conditions , 2014 .
[19] T. Ishikawa,et al. High-resolution multislice x-ray ptychography of extended thick objects. , 2014, Physical review letters.
[20] Leslie J. Allen,et al. Deterministic electron ptychography at atomic resolution , 2014 .
[21] Andreas Menzel,et al. Reconstructing state mixtures from diffraction measurements , 2013, Nature.
[22] D. Muller,et al. Efficient elastic imaging of single atoms on ultrathin supports in a scanning transmission electron microscope. , 2012, Ultramicroscopy.
[23] J. Rodenburg,et al. Ptychographic transmission microscopy in three dimensions using a multi-slice approach. , 2012, Journal of the Optical Society of America. A, Optics, image science, and vision.
[24] Jannik C. Meyer,et al. Accurate measurement of electron beam induced displacement cross sections for single-layer graphene. , 2012, Physical review letters.
[25] J. Rodenburg,et al. Ptychographic electron microscopy using high-angle dark-field scattering for sub-nanometre resolution imaging , 2012, Nature Communications.
[26] K. Nugent,et al. Atom-scale ptychographic electron diffractive imaging of boron nitride cones. , 2012, Physical review letters.
[27] J. Rodenburg,et al. Extended ptychography in the transmission electron microscope: possibilities and limitations. , 2011, Ultramicroscopy.
[28] U Kaiser,et al. Transmission electron microscopy at 20 kV for imaging and spectroscopy. , 2011, Ultramicroscopy.
[29] Fucai Zhang,et al. Superresolution imaging via ptychography. , 2011, Journal of the Optical Society of America. A, Optics, image science, and vision.
[30] Pinshane Y. Huang,et al. Grains and grain boundaries in single-layer graphene atomic patchwork quilts , 2010, Nature.
[31] J. Rodenburg,et al. Wave-front phase retrieval in transmission electron microscopy via ptychography , 2010 .
[32] S. Pennycook,et al. Atom-by-atom structural and chemical analysis by annular dark-field electron microscopy , 2010, Nature.
[33] H. Sawada,et al. STEM imaging of 47-pm-separated atomic columns by a spherical aberration-corrected electron microscope with a 300-kV cold field emission gun. , 2009, Journal of electron microscopy.
[34] J. Rodenburg,et al. An improved ptychographical phase retrieval algorithm for diffractive imaging. , 2009, Ultramicroscopy.
[35] Ulrich Dahmen,et al. Atomic-resolution imaging with a sub-50-pm electron probe. , 2009, Physical review letters.
[36] O. Bunk,et al. High-Resolution Scanning X-ray Diffraction Microscopy , 2008, Science.
[37] Jannik C. Meyer,et al. Imaging and dynamics of light atoms and molecules on graphene , 2008, Nature.
[38] A. G. Cullis,et al. Transmission microscopy without lenses for objects of unlimited size. , 2007, Ultramicroscopy.
[39] A. G. Cullis,et al. Hard-x-ray lensless imaging of extended objects. , 2007, Physical review letters.
[40] O. L. Krivanek,et al. Sub-ångstrom resolution using aberration corrected electron optics , 2002, Nature.
[41] Bernd Kabius,et al. Electron microscopy image enhanced , 1998, Nature.
[42] John M. Rodenburg,et al. Electron ptychography. I. Experimental demonstration beyond the conventional resolution limits , 1998 .
[43] A. Kirfel,et al. New analytical scattering‐factor functions for free atoms and ions , 1995 .
[44] R. Henderson. The potential and limitations of neutrons, electrons and X-rays for atomic resolution microscopy of unstained biological molecules , 1995, Quarterly Reviews of Biophysics.
[45] B. C. McCallum,et al. Resolution beyond the 'information limit' in transmission electron microscopy , 1995, Nature.
[46] John M. Rodenburg,et al. Beyond the conventional information limit: the relevant coherence function , 1994 .
[47] J. Rodenburg,et al. The theory of super-resolution electron microscopy via Wigner-distribution deconvolution , 1992, Philosophical Transactions of the Royal Society of London. Series A: Physical and Engineering Sciences.
[48] A. Rose,et al. Vision: human and electronic , 1973 .
[49] G. Smirnov,et al. Possibilities and Limitations , 1970 .
[50] W. Hoppe. Beugung im inhomogenen Primärstrahlwellenfeld. I. Prinzip einer Phasenmessung von Elektronenbeungungsinterferenzen , 1969 .
[51] E. H. Linfoot,et al. Spherical aberration and the information content of optical images , 1957, Proceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences.
[52] D. Gabor. A New Microscopic Principle , 1948, Nature.
[53] C. M. Sparrow. On Spectroscopic Resolving Power , 1916 .
[54] Abbe. The Relation of Aperture and Power in the Microscope , 1882 .