Analyzing the Impact of Single-Event-Induced Charge Sharing in Complex Circuits

This paper proposes a soft error characterization methodology to analyze multiple faults caused by single-event-induced charge sharing in standard-cell based ASIC designs. Fault injection campaigns have been executed using data provided by placement analysis as well as a pulse width modeling through electrical simulation. Experimental results demonstrate that the error rate can be largely overestimated if placement is not considered.