论文信息 - Defects of SiC nanowires studied by STM and STS - 字舞流文

Defects of SiC nanowires studied by STM and STS

Z. Klusek | A. Huczko | T. Dudziak | W. Kozłowski | W. Olejniczak | M. Cichomski | M. Puchalski | S. Cudziło | A. Busiakiewicz