论文信息 - Compton profiles of aluminium and silicon

Compton profiles of aluminium and silicon

Compton profiles of aluminium and silicon have been measured using 29.5 keV synchrotron radiation X-rays with a momentum resolution of 0.084 au. Comparison of the profiles with the corresponding angular correlation curves of positron annihilation radiation gives for the first time direct information about the effect of the positron on real interacting electron systems.

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