Analytical modeling of proximity and skin effects for millimeter-wave inductors simulation and design in nano Si CMOS
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Analytical models of proximity and skin effects have been developed in this paper to calculate and predict the frequency dependent resistance, Re(Z<sub>in</sub>) and quality factor, Q for mm-wave inductor design. The derived models incorporate layout and material parameters, and frequency in an explicit form suitable for circuit simulation. The accuracy has been proven by a close match with Re(Z<sub>in</sub>) and Q measured from mm-wave inductor (L<sub>dc</sub>~150pH, Q<sub>max</sub>~17, f<sub>SR</sub>≫65GHz) fabricated by 65nm CMOS process with 0.9μm standard top metal.
[1] Yu Cao,et al. Frequency-independent equivalent-circuit model for on-chip spiral inductors , 2003 .
[2] N. M. Ibrahim,et al. Analysis of current crowding effects in multiturn spiral inductors , 2001 .
[3] H. A. Wheeler. Formulas for the Skin Effect , 1942, Proceedings of the IRE.
[4] Jyh-Chyurn Guo,et al. Narrow-Width Effect on High-Frequency Performance and RF Noise of Sub-40-nm Multifinger nMOSFETs and pMOSFETs , 2013, IEEE Transactions on Electron Devices.