On the prediction of digital circuit susceptibility to radiated EMI

The effects of radiated radio-frequency interference (RFI) on the operation of digital systems are studied by simulating the response of simple logic circuits to incident plane waves. The simulation is accomplished by combining a linear electromagnetic moment-method model of the wire structure with a nonlinear circuit model of the solid-state components. The complete model is analyzed in the linear and nonlinear regimes as an example. It is shown how a circuit simulator, such as SPICE, can be used in the analysis of an arbitrary wire network loaded with logic circuits, by the process of representing the linear wire network as a lumped-element N-port /spl pi/ network and interfacing it to the nonlinear circuit simulator. Examples are given that demonstrate the occurrence of both static and dynamic failures under various RFI-field excitations and wire structure geometries. The prediction methods presented in this paper, can be used by EMC engineers to assess the likelihood of failures in RFI-exposed digital systems,.

[1]  S. Zaky,et al.  Prediction of delays induced by in-band RFI in CMOS inverters , 1995 .

[2]  Steven C. Anderson,et al.  EMI Noise Susceptibility of ESD Protect Buffers in Selected MOS Devices , 1985, 1985 IEEE International Symposium on Electromagnetic Compatibility.

[3]  Keith G. Balmain,et al.  A multiradius, reciprocal implementation of the thin-wire moment method , 1990 .

[4]  C. R. Paul,et al.  Direct prediction of common-mode currents , 1991, IEEE 1991 International Symposium on Electromagnetic Compatibility.

[5]  D. Kenneally,et al.  RF upset susceptibilities of CMOS and low power Schottky D-type flip-flops , 1989, National Symposium on Electromagnetic Compatibility.

[6]  S. Caniggia,et al.  Models for circuit simulators to analyze crosstalk and radiation into wires , 1988, IEEE 1988 International Symposium on Electromagnetic Compatibility.

[7]  Joseph Tront Predicting URF Upset of MOSFET Digital IC's , 1985, IEEE Transactions on Electromagnetic Compatibility.

[8]  G. I. Costache,et al.  A model to predict radiated emissions from electronic circuits , 1991, IEEE 1991 International Symposium on Electromagnetic Compatibility.

[9]  K. Balmain,et al.  On the suppression of asymmetric artifacts arising in an implementation of the thin-wire method of moments , 1990 .

[10]  J.F. Chappel,et al.  EMI-induced Delays In Digital Circuits: Application , 1992, International Symposium on Electromagnetic Compatibility.