Effects of interfacial pressure on tracking failure between XLPE and silicon rubber

XLPE power cables are increasingly used in power distribution system for their excellent mechanical and electrical performance. However, interface between XLPE and silicon rubber in cable joint remains one of the weakest part of the cable system, because aging and relaxation of silicon rubber may reduce the interfacial pressure and then cause interfacial discharge and tracking failure. Therefore, this paper investigates the effects of interfacial pressure on interface discharge and tracking failure at the interface. Test samples were made by pressing a piece of XLPE and silicon rubber together under different interfacial pressures. AC voltage was applied on a pair of needle-plate electrodes at the interface with the insulation distance of 10 mm. Both the initial discharge voltage and the time to tracking failure were recorded with variation of the interfacial pressure and the applied voltage. Meanwhile, the discharge light and the carbonized configuration were also captured by using a high-speed camera. In order to quantify the light and the carbonization, the methods of image processing and fractal dimension (FD) were employed to establish the relationship between the quantitative characteristics of tracking process and the interfacial pressures. The results show that both the initial discharge voltage and the time to tracking failure increase with the increase of interfacial pressure. With increasing the interfacial pressure, the FDs of discharge light and carbonization path show the decreasing tendency, which indicates that the higher interfacial pressure can effectively delay the interfacial discharges and the tracking failure.

[1]  R. Sarathi,et al.  Understanding the hydrophobic characteristics of epoxy nanocomposites using wavelets and fractal technique , 2008, IEEE Transactions on Dielectrics and Electrical Insulation.

[2]  G. C. Montanari,et al.  Comparison of electrical aging tests on epr-insulated minicables and ribbons from full-sized EPR cab , 1995, IEEE Transactions on Dielectrics and Electrical Insulation.

[3]  V. Cooray,et al.  Correlation between Brightness and Channel Currents of Electrical Discharges , 2007, IEEE Transactions on Dielectrics and Electrical Insulation.

[4]  B.X. Du,et al.  Effects of atmospheric pressure on DC resistance to tracking of polymer insulating materials , 2005, IEEE Transactions on Dielectrics and Electrical Insulation.

[5]  B. Du,et al.  Recurrence plot analysis of discharge currents in tracking tests of gamma-ray irradiated polymers , 2008, IEEE Transactions on Dielectrics and Electrical Insulation.

[6]  Chaos Analysis of Discharge Current on Phenolic Resin under Reduced Pressure , 2006, 2006 International Symposium on Discharges and Electrical Insulation in Vacuum.

[7]  K. Yasuoka,et al.  Electroluminescence in insulating polymers in ac electric fields , 1997 .

[8]  R. J. Densley,et al.  Degradation mechanism at XLPE/semicon interface subjected to high electrical stress , 1991 .

[9]  V. Englund,et al.  Synthesis and efficiency of voltage stabilizers for XLPE cable insulation , 2009, IEEE Transactions on Dielectrics and Electrical Insulation.

[10]  A. Tzimas,et al.  Effect of long-time electrical and thermal stresses upon the endurance capability of cable insulation material , 2009, IEEE Transactions on Dielectrics and Electrical Insulation.

[11]  D. Fournier,et al.  Effect of pressure and length on interfacial breakdown between two dielectric surfaces , 1992, Conference Record of the 1992 IEEE International Symposium on Electrical Insulation.

[12]  B. Du,et al.  The application of recurrence plot in DC tracking test of gamma-ray irradiated polycarbonate , 2009, IEEE Transactions on Dielectrics and Electrical Insulation.

[13]  B. Du,et al.  Effects of low pressure on tracking failure of printed circuit boards , 2008, IEEE Transactions on Dielectrics and Electrical Insulation.

[14]  R. Bodega,et al.  On-site testing and PD diagnosis of high voltage power cables , 2008, IEEE Transactions on Dielectrics and Electrical Insulation.

[15]  V. Rajini,et al.  Quantification of Damage due to Surface Tracking , 2007, IEEE Transactions on Dielectrics and Electrical Insulation.

[16]  Seiji Kumagai,et al.  Research in Japan on the tracking phenomenon of electrical insulating materials , 1997 .

[17]  D. Tu,et al.  Interfacial microstructure and withstand voltage of polyethylene for power cables , 2003 .

[18]  T. Okamoto,et al.  Interfacial improvement of XLPE cable insulation at reduced thickness , 1996 .

[19]  B. X. Du,et al.  Discharge energy and dc tracking resistance of organic insulating materials , 2001 .

[20]  H. Okubo,et al.  Cross-sectional comparison of insulation degradation mechanisms and lifetime evaluation of power transmission equipment , 2009, IEEE Transactions on Dielectrics and Electrical Insulation.

[21]  L. Dissado,et al.  Application of thermoelectric aging models to polymeric insulation in cable geometry , 2005, IEEE Transactions on Dielectrics and Electrical Insulation.

[22]  B. Du,et al.  Effects of gamma-ray irradiation on dielectric surface breakdown of polybutylene polymers , 2007, IEEE Transactions on Dielectrics and Electrical Insulation.

[23]  G. Finis,et al.  On the dielectric breakdown behavior of silicone gel under various stress conditions , 2007, IEEE Transactions on Dielectrics and Electrical Insulation.

[24]  Y. Ohki,et al.  Breakdown strength at the interface between epoxy resin and silicone rubber-a basic study for the development of all solid insulation , 2005, IEEE Transactions on Dielectrics and Electrical Insulation.

[25]  H. Hillborg,et al.  Properties of interfaces between silicone rubber and epoxy , 2008, IEEE Transactions on Dielectrics and Electrical Insulation.

[26]  T. Tanaka,et al.  Aging of polymeric and composite insulating materials. Aspects of interfacial performance in aging , 2002 .