论文信息 - Structure, microstructure and electronic characterisation of the Al2O3/SiO2 interface by electron spectroscopies - 字舞流文

Structure, microstructure and electronic characterisation of the Al2O3/SiO2 interface by electron spectroscopies

F. Yubero | A. Gonzalez-Elipe | J. P. Espinós | R. Reiche | A. González‐Elipe | J. Espinós