Optical sensors are gaining increasing importance in the field of coordinate metrology. Especially for micro range measurements, different optical sensor principles (e.g. white-light interferometers, autofocus sensors, and confocal microscopes) are used. Micro measurement covers the detection and evaluation of measurands for length, size and form of geometrical structures in the range between 1 μm and 1 mm. These reduced dimensions lead to increased requirements for the applied measuring technique and the verification of the measurement systems. The Physikalisch- Technische Bundesanstalt (PTB) works intensively on the development of suitable measurement standards and test procedures to make a broader industrial use of CMMs with optical sensors possible. The test procedures are analogue to the well-established tests for classical coordinate measuring machines (CMMs). For this purpose, adequate and miniaturized reference standards were manufactured, calibrated and tested considering the specific characteristics of optical sensors. This paper gives a summary of this work. Advice on future developments is given.
[1]
L. Deck,et al.
High-speed noncontact profiler based on scanning white-light interferometry.
,
1994,
Applied optics.
[2]
R. Thalmann,et al.
Ultraprecision micro-CMM using a low force 3D touch probe
,
2007
.
[3]
R. Christoph,et al.
Multisensor Coordinate Metrology
,
2011
.
[4]
Ulrich Neuschaefer-Rube,et al.
Artefacts with rough surfaces for verification of optical microsensors
,
2007,
SPIE Optical Metrology.
[5]
Michael Neugebauer,et al.
Tactile and Optical Microsensors - Test Procedures and Standards
,
2008
.
[6]
Tino Hausotte,et al.
New applications of the nanopositioning and nanomeasuring machine by using advanced tactile and non-tactile probes
,
2007
.
[7]
Michael Neugebauer,et al.
Ein geometrisches Normal zur Prüfung von Röntgen-Mikro-Computertomografiemesssystemen (A Geometrical Standard for Testing of X-Ray Computer Tomography)
,
2007
.