Rapid Failure Analysis Using

This paper describes a new methodology for rapid failure analysis. The methodology is based on the contamination- defect-fault (CDF) simulator CODEF, which is able to map the effects of contamination deposited on an IC cell during any stage of the manufacturing process, onto circuit-level faults. The utilization of CODEF's capabilities-in both single contamination mode and Monte Carlo mode-in speeding up failure analysis is illustrated in the paper with examples.

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