Some developments on outlier-tolerant data processing with applications

Owing to the complexity of sampling processes and running environment of the system, it is hard to avoid abnormal data such as outliers as well as patchy outliers, which widely emerge out of the sampling series. These abnormal data have remarkably bad impact on state estimation, process monitoring, process control as well as safe running of the dynamic system. In this paper, a detailed review is given to describe some research courses and prominent approaches and status quo of outlier-tolerant computation, such as outlier-tolerant estimation, outlier-tolerant identification, outlier-tolerant filtering, outlier-tolerant prediction, etc. At the end of this paper, three open problems are pointed out.