Automated minimization of concurrent online checkers for Network-on-Chips
暂无分享,去创建一个
Jaan Raik | Thomas Hollstein | Gert Jervan | Pietro Saltarelli | Behrad Niazmand | Ranganathan Hariharan
[1] Yiorgos Makris,et al. Concurrent fault detection in random combinational logic , 2003, Fourth International Symposium on Quality Electronic Design, 2003. Proceedings..
[2] Jay M. Berger. A Note on Error Detection Codes for Asymmetric Channels , 1961, Inf. Control..
[3] R. Iris Bahar,et al. Enhancing online error detection through area-efficient multi-site implications , 2011, 29th VLSI Test Symposium.
[4] Raimund Ubar,et al. Parallel X-fault simulation with critical path tracing technique , 2010, 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010).
[5] Artur Jutman,et al. Turbo Tester – diagnostic package for research and training , 2003 .
[6] Nur A. Touba,et al. Synthesis of low-cost parity-based partially self-checking circuits , 2003, 9th IEEE On-Line Testing Symposium, 2003. IOLTS 2003..
[7] Paul Ampadu,et al. Transient and Permanent Error Control for High-End Multiprocessor Systems-on-Chip , 2012, 2012 IEEE/ACM Sixth International Symposium on Networks-on-Chip.
[8] Chrysostomos Nicopoulos,et al. NoCAlert: An On-Line and Real-Time Fault Detection Mechanism for Network-on-Chip Architectures , 2012, 2012 45th Annual IEEE/ACM International Symposium on Microarchitecture.
[9] Armin Alaghi,et al. Online NoC Switch Fault Detection and Diagnosis Using a High Level Fault Model , 2007, 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007).
[10] José Duato,et al. Logic-Based Distributed Routing for NoCs , 2008, IEEE Computer Architecture Letters.
[11] Nur A. Touba,et al. Synthesis of low power CED circuits based on parity codes , 2005, 23rd IEEE VLSI Test Symposium (VTS'05).
[12] S. Katkoori,et al. Selective triple Modular redundancy (STMR) based single-event upset (SEU) tolerant synthesis for FPGAs , 2004, IEEE Transactions on Nuclear Science.
[13] R. Ubar,et al. Structurally synthesized binary decision diagrams , 2004 .
[14] Kewal K. Saluja,et al. An implementation and analysis of a concurrent built-in self-test technique , 1988, [1988] The Eighteenth International Symposium on Fault-Tolerant Computing. Digest of Papers.
[15] Valeria Bertacco,et al. Formally enhanced runtime verification to ensure NoC functional correctness , 2011, 2011 44th Annual IEEE/ACM International Symposium on Microarchitecture (MICRO).
[16] Zeljko Zilic,et al. Assertion Checkers in Verification, Silicon Debug and In-Field Diagnosis , 2007, 8th International Symposium on Quality Electronic Design (ISQED'07).