论文信息 - Microstructural defect characterisation of a-Si:H deposited by low temperature HW-CVD on paper substrates - 字舞流文

Microstructural defect characterisation of a-Si:H deposited by low temperature HW-CVD on paper substrates

D. Knoesen | W. Egger | D. Britton | M. Härting | P. Sperr | T. Ntsoane | M. Nippus | Z. Sigcau | F. P. Nemalili