Ray tracing for the optics at nano‐textured ZnO–air and ZnO–silicon interfaces
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Karsten Bittkau | Helmut Stiebig | Uwe Rau | Jürgen Hüpkes | Bart E. Pieters | S. Jorke | M. Schulte | U. Rau | J. Hüpkes | M. Schulte | H. Stiebig | K. Bittkau | B. Pieters | S. Jorke
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