Imaging and direct manipulation of nanoscale three-dimensional features using the noncontact atomic force microscope

We report on a remarkable image contrast reversal in noncontact atomic force microscope (NC-AFM) imaging of nanosized three-dimensional (3D) particles. We show that the image contrast of such 3D particles can switch from positive to negative as a function of NC-AFM imaging conditions and this occurs during, both, in situ ultrahigh vacuum imaging and imaging in air. Our results indicate that the contrast reversal can arise from a tip-sample interaction force-gradient-dependent instability of the NC-AFM feedback loop. Exploiting the above instability to induce selective tip-sample contact, we propose and demonstrate a protocol for the controlled nanomanipulation of 5 nm diameter gold particles, in air at room temperature using the NC-AFM. The contrast reversal phenomenon is proposed to be universal, suggesting its potential applicability to nanomanipulation in a variety of materials systems.

[1]  Nobuhiko P. Kobayashi,et al.  In situ, atomic force microscope studies of the evolution of InAs three‐dimensional islands on GaAs(001) , 1996 .

[2]  P. Guethner.  Simultaneous imaging of Si(111) 7×7 with atomic resolution in scanning tunneling microscopy, atomic force microscopy, and atomic force microscopy noncontact mode , 1996 .

[3]  D. Rugar,et al.  Frequency modulation detection using high‐Q cantilevers for enhanced force microscope sensitivity , 1991 .

[4]  J. M. Moison,et al.  Self‐organized growth of regular nanometer‐scale InAs dots on GaAs , 1994 .

[5]  Hemantha K. Wickramasinghe,et al.  Atomic force microscope–force mapping and profiling on a sub 100‐Å scale , 1987 .

[6]  J. E. Griffith,et al.  Dimensional metrology with scanning probe microscopes , 1993 .

[7]  P. Mårtensson,et al.  Inequivalent atoms and imaging mechanisms in ac-mode atomic-force microscopy of Si(111)7 x 7. , 1996, Physical review. B, Condensed matter.

[8]  Krueger,et al.  Cantilever dynamics in quasinoncontact force microscopy: Spectroscopic aspects. , 1996, Physical review. B, Condensed matter.

[9]  C. Gerber,et al.  Atomic resolution in dynamic force microscopy across steps on Si(1 1 1)7×7 , 1996 .

[10]  The Formation and Evolution of InAs 3D Islands on GaAs(001) and a Comparative C-AFM and NC-AFM Study of InAs 3D Islands , 1996 .

[11]  L. Samuelson,et al.  Controlled manipulation of nanoparticles with an atomic force microscope , 1995 .

[12]  F. Giessibl,et al.  Atomic Resolution of the Silicon (111)-(7x7) Surface by Atomic Force Microscopy , 1995, Science.

[13]  Reifenberger,et al.  Identification of electrostatic and van der Waals interaction forces between a micrometer-size sphere and a flat substrate. , 1996, Physical review. B, Condensed matter.

[14]  Russell M. Taylor,et al.  Manipulation of individual viruses: friction and mechanical properties. , 1997, Biophysical journal.

[15]  Aristides A. G. Requicha,et al.  Robotic nanomanipulation with a scanning probe microscope in a networked computing environment , 1997 .

[16]  Toshiro Isu,et al.  Threshold height for movement of C60 molecules on Si(111)‐7×7 with a scanning tunneling microscope , 1993 .

[17]  James K. Gimzewski,et al.  Room‐temperature repositioning of individual C60 molecules at Cu steps: Operation of a molecular counting device , 1996 .

[18]  Dürig,et al.  Mapping of short-range adhesive forces by scanning tunneling microscopy. , 1994, Physical review. B, Condensed matter.

[19]  Hartmann.  van der Waals interactions between sharp probes and flat sample surfaces. , 1991, Physical review. B, Condensed matter.

[20]  M. Payne,et al.  ROLE OF COVALENT TIP-SURFACE INTERACTIONS IN NONCONTACT ATOMIC FORCE MICROSCOPY ON REACTIVE SURFACES , 1997 .

[21]  M. Ohta,et al.  True atomic resolution imaging with noncontact atomic force microscopy , 1997 .